Large Margin Metric Learning for Multi-Label Prediction

Authors

  • Weiwei Liu University of Technology, Sydney
  • Ivor Tsang University of Technology, Sydney

DOI:

https://doi.org/10.1609/aaai.v29i1.9610

Keywords:

Multi-label prediction,Metric Learning,$k$ Nearest Neighbors

Abstract

Canonical correlation analysis (CCA) and maximum margin output coding (MMOC) methods have shown promising results for multi-label prediction, where each instance is associated with multiple labels. However, these methods require an expensive decoding procedure to recover the multiple labels of each testing instance. The testing complexity becomes unacceptable when there are many labels. To avoid decoding completely, we present a novel large margin metric learning paradigm for multi-label prediction. In particular, the proposed method learns a distance metric to discover label dependency such that instances with very different multiple labels will be moved far away. To handle many labels, we present an accelerated proximal gradient procedure to speed up the learning process. Comprehensive experiments demonstrate that our proposed method is significantly faster than CCA and MMOC in terms of both training and testing complexities. Moreover, our method achieves superior prediction performance compared with state-of-the-art methods.

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Published

2015-02-21

How to Cite

Liu, W., & Tsang, I. (2015). Large Margin Metric Learning for Multi-Label Prediction. Proceedings of the AAAI Conference on Artificial Intelligence, 29(1). https://doi.org/10.1609/aaai.v29i1.9610

Issue

Section

Main Track: Novel Machine Learning Algorithms