Pan, Jeff Yung-Choa, and Jay M. Tenenbaum. “PIES: An Engineer’s Do-It-Yourself Knowledge System for Interpretation of Parametric Test Data”. AI Magazine 7, no. 4 (September 15, 1986): 62. Accessed March 28, 2024. https://ojs.aaai.org/aimagazine/index.php/aimagazine/article/view/559.