Ba Z, Liu Q, Liu Z, Wu S, Lin F, Lu L, Ren K. Exposing the Deception: Uncovering More Forgery Clues for Deepfake Detection. AAAI [Internet]. 2024Mar.24 [cited 2024Nov.18];38(2):719-28. Available from: https://ojs.aaai.org/index.php/AAAI/article/view/27829