Ba, Zhongjie, Qingyu Liu, Zhenguang Liu, Shuang Wu, Feng Lin, Li Lu, and Kui Ren. “Exposing the Deception: Uncovering More Forgery Clues for Deepfake Detection”. Proceedings of the AAAI Conference on Artificial Intelligence 38, no. 2 (March 24, 2024): 719-728. Accessed November 18, 2024. https://ojs.aaai.org/index.php/AAAI/article/view/27829.