Lee, K. J., J. W. Kwon, S. Min, and J. Yoon. “Embedding Convolution Neural Network-Based Defect Finder for Deployed Vision Inspector in Manufacturing Company Frontec”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 34, no. 08, Apr. 2020, pp. 13164-71, doi:10.1609/aaai.v34i08.7020.