Feldman, A., I. Pill, F. Wotawa, I. Matei, and J. de Kleer. “Efficient Model-Based Diagnosis of Sequential Circuits”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 34, no. 03, Apr. 2020, pp. 2814-21, doi:10.1609/aaai.v34i03.5670.