Wang, Q., B. Han, T. Liu, G. Niu, J. Yang, and C. Gong. “Tackling Instance-Dependent Label Noise via a Universal Probabilistic Model”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 35, no. 11, May 2021, pp. 10183-91, doi:10.1609/aaai.v35i11.17221.