Guo, Bingyang, et al. “Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 40, no. 6, Mar. 2026, pp. 4385-94, doi:10.1609/aaai.v40i6.42436.