Cheng, Y., Y. Sun, H. Zhang, W. Shen, and Y. Cao. “Towards High-Resolution 3D Anomaly Detection: A Scalable Dataset and Real-Time Framework for Subtle Industrial Defects”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 40, no. 5, Mar. 2026, pp. 3327-34, doi:10.1609/aaai.v40i5.37328.