Ovalle, A., E. Czyzycki, and C.-J. Hsieh. “Improving Adversarial Robustness to Sensitivity and Invariance Attacks With Deep Metric Learning (Student Abstract)”. Proceedings of the AAAI Conference on Artificial Intelligence, vol. 37, no. 13, July 2024, pp. 16292-3, doi:10.1609/aaai.v37i13.27006.