[1]
T. Xin, J.-L. Xiao, Z. Xia, S. Yin, and L.-J. Deng, “Training and Inference Within 1 Second – Tackle Cross-Sensor Degradation of Real-World Pansharpening with Efficient Residual Feature Tailoring”, AAAI, vol. 40, no. 13, pp. 11141–11149, Mar. 2026.