Takaya, Eichi, Yusuke Takeichi, Mamiko Ozaki, and Satoshi Kurihara. 2019. “Semi-Supervised Learning for Electron Microscopy Image Segmentation”. Proceedings of the AAAI Conference on Artificial Intelligence 33 (01):10047-48. https://doi.org/10.1609/aaai.v33i01.330110047.