LIU, W.; TSANG, I. Large Margin Metric Learning for Multi-Label Prediction. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 29, n. 1, 2015. DOI: 10.1609/aaai.v29i1.9610. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/9610. Acesso em: 26 sep. 2024.