LEE, K. J.; KWON, J. W.; MIN, S.; YOON, J. Embedding Convolution Neural Network-Based Defect Finder for Deployed Vision Inspector in Manufacturing Company Frontec. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 08, p. 13164-13171, 2020. DOI: 10.1609/aaai.v34i08.7020. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/7020. Acesso em: 17 aug. 2022.