SHU, M.; LIU, C.; QIU, W.; YUILLE, A. Identifying Model Weakness with Adversarial Examiner. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 07, p. 11998-12006, 2020. DOI: 10.1609/aaai.v34i07.6876. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/6876. Acesso em: 28 mar. 2024.