FELDMAN, A.; PILL, I.; WOTAWA, F.; MATEI, I.; DE KLEER, J. Efficient Model-Based Diagnosis of Sequential Circuits. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 03, p. 2814-2821, 2020. DOI: 10.1609/aaai.v34i03.5670. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/5670. Acesso em: 19 apr. 2024.