AGARWAL, M.; LEEKHA, M.; SAWHNEY, R.; SHAH, R. R. Crisis-DIAS: Towards Multimodal Damage Analysis - Deployment, Challenges and Assessment. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 01, p. 346-353, 2020. DOI: 10.1609/aaai.v34i01.5369. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/5369. Acesso em: 25 feb. 2021.