TAKAYA, E.; TAKEICHI, Y.; OZAKI, M.; KURIHARA, S. Semi-Supervised Learning for Electron Microscopy Image Segmentation. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 33, n. 01, p. 10047-10048, 2019. DOI: 10.1609/aaai.v33i01.330110047. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/5160. Acesso em: 29 mar. 2024.