LEE, S.-G.; KIM, J.; JUNG, H.-J.; CHOE, Y. Comparing Sample-Wise Learnability across Deep Neural Network Models. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 33, n. 01, p. 9961-9962, 2019. DOI: 10.1609/aaai.v33i01.33019961. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/5117. Acesso em: 25 apr. 2024.