LEE, K.; SOOD, A.; CRAVEN, M. Understanding Learned Models by Identifying Important Features at the Right Resolution. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 33, n. 01, p. 4155-4163, 2019. DOI: 10.1609/aaai.v33i01.33014155. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/4318. Acesso em: 28 jun. 2022.