BA, Z.; LIU, Q.; LIU, Z.; WU, S.; LIN, F.; LU, L.; REN, K. Exposing the Deception: Uncovering More Forgery Clues for Deepfake Detection. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 38, n. 2, p. 719-728, 2024. DOI: 10.1609/aaai.v38i2.27829. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/27829. Acesso em: 8 may. 2024.