XU, Y.; NIU, X.; YANG, J.; DREW, S.; ZHOU, J.; CHEN, R. USDNL: Uncertainty-Based Single Dropout in Noisy Label Learning. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 37, n. 9, p. 10648-10656, 2023. DOI: 10.1609/aaai.v37i9.26264. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/26264. Acesso em: 20 may. 2024.