WANG, Z.; WANG, L.; WU, T.; LI, T.; WU, G. Negative Sample Matters: A Renaissance of Metric Learning for Temporal Grounding. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 36, n. 3, p. 2613-2623, 2022. DOI: 10.1609/aaai.v36i3.20163. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/20163. Acesso em: 21 sep. 2024.