SUN, K.; YAO, T.; CHEN, S.; DING, S.; LI, J.; JI, R. Dual Contrastive Learning for General Face Forgery Detection. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 36, n. 2, p. 2316-2324, 2022. DOI: 10.1609/aaai.v36i2.20130. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/20130. Acesso em: 13 apr. 2024.