GU, Q.; CHEN, S.; YAO, T.; CHEN, Y.; DING, S.; YI, R. Exploiting Fine-Grained Face Forgery Clues via Progressive Enhancement Learning. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 36, n. 1, p. 735-743, 2022. DOI: 10.1609/aaai.v36i1.19954. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/19954. Acesso em: 24 apr. 2024.