SUN, X.; ZHANG, Z.; REN, X.; LUO, R.; LI, L. Exploring the Vulnerability of Deep Neural Networks: A Study of Parameter Corruption. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 13, p. 11648-11656, 2021. DOI: 10.1609/aaai.v35i13.17385. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/17385. Acesso em: 19 apr. 2024.