CHEN, P.; YE, J.; CHEN, G.; ZHAO, J.; HENG, P.-A. Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 13, p. 11451-11461, 2021. DOI: 10.1609/aaai.v35i13.17364. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/17364. Acesso em: 25 apr. 2024.