YANG, Z.; HAN, Y.; ZHANG, X. Characterizing the Evasion Attackability of Multi-label Classifiers. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 12, p. 10647-10655, 2021. DOI: 10.1609/aaai.v35i12.17273. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/17273. Acesso em: 19 apr. 2024.