BHATIA, S.; JAIN, A.; HOOI, B. ExGAN: Adversarial Generation of Extreme Samples. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 8, p. 6750-6758, 2021. DOI: 10.1609/aaai.v35i8.16834. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/16834. Acesso em: 29 mar. 2024.