LEE, C.; ZAME, W.; YOON, J.; VAN DER SCHAAR, M. DeepHit: A Deep Learning Approach to Survival Analysis With Competing Risks. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 32, n. 1, 2018. DOI: 10.1609/aaai.v32i1.11842. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/11842. Acesso em: 6 jul. 2022.