HSIEH, C.-Y.; LIN, Y.-A.; LIN, H.-T. A Deep Model With Local Surrogate Loss for General Cost-Sensitive Multi-Label Learning. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 32, n. 1, 2018. DOI: 10.1609/aaai.v32i1.11816. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/11816. Acesso em: 18 jul. 2024.