WANG, D.; TAN, X. Robust Distance Metric Learning in the Presence of Label Noise. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 28, n. 1, 2014. DOI: 10.1609/aaai.v28i1.8903. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/8903. Acesso em: 12 nov. 2024.