ZHANG, B.; XIAO, J.; WEI, Y.; SUN, M.; HUANG, K. Reliability Does Matter: An End-to-End Weakly Supervised Semantic Segmentation Approach. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 07, p. 12765-12772, 2020. DOI: 10.1609/aaai.v34i07.6971. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/6971. Acesso em: 12 sep. 2024.