GUO, Bingyang; ZUO, Qiang; YU, Ruiyun. Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 40, n. 6, p. 4385–4394, 2026. DOI: 10.1609/aaai.v40i6.42436. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/42436. Acesso em: 11 may. 2026.