FELDMAN, Alexander; PILL, Ingo; WOTAWA, Franza; MATEI, Ion; DE KLEER, Johan. Efficient Model-Based Diagnosis of Sequential Circuits. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 34, n. 03, p. 2814–2821, 2020. DOI: 10.1609/aaai.v34i03.5670. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/5670. Acesso em: 14 may. 2026.