Y, Rithvik; SINGHAL, Bhavuk; JAIN, Shubham; GARG, Akshat; TANWAR, Karan; ADITYA, Anshu; MUKHERJEE, Debashis; MUKHERJEE, Debdoot. TRUST: Transaction Risk via Unified Sequence and Topology. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 40, n. 47, p. 40147–40156, 2026. DOI: 10.1609/aaai.v40i47.41450. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/41450. Acesso em: 24 may. 2026.