PAN, Weiran; WEI, Wei; ZHU, Feida; DENG, Yong. Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled Yet Hard-to-Learn Samples in Noisy Data. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 39, n. 19, p. 19795–19803, 2025. DOI: 10.1609/aaai.v39i19.34180. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/34180. Acesso em: 16 may. 2026.