LYU, Shuai; ZHANG, Rongchen; MA, Zeqi; LIAO, Fangjian; MO, Dongmei; WONG, Waikeung. MVREC: A General Few-shot Defect Classification Model Using Multi-View Region-Context. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 39, n. 6, p. 5937–5945, 2025. DOI: 10.1609/aaai.v39i6.32634. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/32634. Acesso em: 8 may. 2026.