BARKAN, Oren; ELISHA, Yehonatan; WEILL, Jonathan; KOENIGSTEIN, Noam. BEE: Metric-Adapted Explanations via Baseline Exploration-Exploitation. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 39, n. 2, p. 1835–1843, 2025. DOI: 10.1609/aaai.v39i2.32178. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/32178. Acesso em: 12 may. 2026.