ZHUGE, Z.; WANG, J.; LI, Y.; BAO, Y.; WANG, P. .; CHENG, J. Patch-Aware Sample Selection for Efficient Masked Image Modeling. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 38, n. 15, p. 17245-17253, 2024. DOI: 10.1609/aaai.v38i15.29671. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/29671. Acesso em: 17 sep. 2024.