OVALLE, A.; CZYZYCKI, E.; HSIEH, C.-J. Improving Adversarial Robustness to Sensitivity and Invariance Attacks with Deep Metric Learning (Student Abstract). Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 37, n. 13, p. 16292-16293, 2023. DOI: 10.1609/aaai.v37i13.27006. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/27006. Acesso em: 10 jul. 2024.