OVALLE, Anaelia; CZYZYCKI, Evan; HSIEH, Cho-Jui. Improving Adversarial Robustness to Sensitivity and Invariance Attacks with Deep Metric Learning (Student Abstract). Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 37, n. 13, p. 16292–16293, 2024. DOI: 10.1609/aaai.v37i13.27006. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/27006. Acesso em: 31 may. 2026.