LU, Yangdi; XU, Zhiwei; HE, Wenbo. Rethinking Label Refurbishment: Model Robustness under Label Noise. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 37, n. 12, p. 15000–15008, 2023. DOI: 10.1609/aaai.v37i12.26751. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/26751. Acesso em: 25 may. 2026.