OHNO, K.; KANAI, S.; IDA, Y. Fast Saturating Gate for Learning Long Time Scales with Recurrent Neural Networks. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 37, n. 8, p. 9319-9326, 2023. DOI: 10.1609/aaai.v37i8.26117. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/26117. Acesso em: 21 nov. 2024.