RAMBHATLA, S.; CHE, Z.; LIU, Y. I-SEA: Importance Sampling and Expected Alignment-Based Deep Distance Metric Learning for Time Series Analysis and Embedding. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 36, n. 7, p. 8045-8053, 2022. DOI: 10.1609/aaai.v36i7.20776. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/20776. Acesso em: 8 nov. 2024.