CHEN, Pengfei; YE, Junjie; CHEN, Guangyong; ZHAO, Jingwei; HENG, Pheng-Ann. Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 13, p. 11451–11461, 2021. DOI: 10.1609/aaai.v35i13.17364. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/17364. Acesso em: 28 may. 2026.