WANG, Q.; HAN, B.; LIU, T.; NIU, G.; YANG, J.; GONG, C. Tackling Instance-Dependent Label Noise via a Universal Probabilistic Model. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 11, p. 10183-10191, 2021. DOI: 10.1609/aaai.v35i11.17221. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/17221. Acesso em: 16 aug. 2024.