HEDDERICH, M. A.; ZHU, D.; KLAKOW, D. Analysing the Noise Model Error for Realistic Noisy Label Data. Proceedings of the AAAI Conference on Artificial Intelligence, [S. l.], v. 35, n. 9, p. 7675-7684, 2021. DOI: 10.1609/aaai.v35i9.16938. Disponível em: https://ojs.aaai.org/index.php/AAAI/article/view/16938. Acesso em: 22 nov. 2024.