Gu, Q., Chen, S., Yao, T., Chen, Y., Ding, S., & Yi, R. (2022). Exploiting Fine-Grained Face Forgery Clues via Progressive Enhancement Learning. Proceedings of the AAAI Conference on Artificial Intelligence, 36(1), 735-743. https://doi.org/10.1609/aaai.v36i1.19954