Robitaille, L.- Émile, Durand, A., Gardner, M.-A., Gagné, C., De Koninck, P., & Lavoie-Cardinal, F. (2018). Learning to Become an Expert: Deep Networks Applied to Super-Resolution Microscopy. Proceedings of the AAAI Conference on Artificial Intelligence, 32(1). https://doi.org/10.1609/aaai.v32i1.11426