Guo, B., Zuo, Q., & Yu, R. (2026). Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology. Proceedings of the AAAI Conference on Artificial Intelligence, 40(6), 4385–4394. https://doi.org/10.1609/aaai.v40i6.42436